Yazar "Tokay, S." için listeleme
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Formation of silicon nanocrystals in sapphire by ion implantation and the origin of visible photoluminescence
Yerci, S.; Serincan, U.; Dogan, I.; Tokay, S.; Genisel, M.; Aydinli, A.; Turan, R. (Amer Inst Physics, 2006)Silicon nanocrystals, average sizes ranging between 3 and 7 nm, were formed in sapphire matrix by ion implantation and subsequent annealing. Evolution of the nanocrystals was detected by Raman spectroscopy and x-ray ... -
Raman and TEM studies of Ge nanocrystal formation in SiOx : Ge/SiOx multilayers
Dana, A.; Agan, S.; Tokay, S.; Aydinh, A.; Finstad, T. G. (Wiley-V C H Verlag Gmbh, 2007)Alternating germanosilicate-siliconoxide layers of 10-30 nm thickness were grown on Si substrates by plasma enhanced chemically vapor deposition (PECVD). The compositions of the grown films were determined by X-ray ...